X-Ray Standing Wave in Resonant Dynamical Diffraction.

• NEGISHI Riichirou

  Advanced Science Research Laboratory, Saitama Institute of Technology

• FUKAMACHI Tomoe

  Department of Electronic Engineering, Saitama Institute of Technology

• KAWAMURA Takaaki

  Faculty of Education & Human Sciences, Yamanashi University

Bibliographic Information

Other Title

• 共鳴散乱動力学回折におけるＸ線定在波
• キョウメイ サンラン ドウリキガク カイセツ ニ オケル Xセン テイザイハ

Abstract

X-ray standing wave method is widely used for determination of atomic position of an adsorbate at surface, an impurity atom in a bulk or an atom at an interface. If the method is combined with X-ray resonant scattering, novel applications are expected as the resonant scattering occurs in a very narrow region of X-ray energy, and the scattering factor and its phase varies in the region. In addition, the improvement in accuracy of atomic positions is expected. The principle idea of X-ray standing wave with resonant scattering is described, together with the variations of X-ray wavef eld around resonant condition both in the Bragg and Laue cases. Change in the fluorescent X-ray emission from GaAs is described as an example to show the variation of the wavefeld.

Journal

• Nihon Kessho Gakkaishi

  Nihon Kessho Gakkaishi 42 (6), 497-503, 2000

  The Crystallographic Society of Japan

Details

• CRID: 1390282679063530880
• NII Article ID: 10007410678
• NII Book ID: AN00188364
• DOI: 10.5940/jcrsj.42.497
• ISSN: 18845576
• ISSN: 03694585
• NDL BIB ID: 5611211
• Web Site: http://id.ndl.go.jp/bib/5611211
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I5611211
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed