硝酸塩,硫酸塩などからのGa・1次イオンTOF-SIMSフラグメントパターン [in Japanese] Inference of Ga-primary Ion TOF-SIMS Fragment Pattern of Nitrates and Sulfates [in Japanese]
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Gallium primary ion TOF-SIMS fragment patterns from some nitrates and sulfates can be qualitatively inferred. Considering the chemical parameters: valence and electron negativity (electron affinity) of cations and anions in fragments, the regularity of fragment pattern appearance behavior from some nitrates and sulfates could be inferred, but the effect of surface contaminants like water should be taken into consideration as in the case of halides and oxides.
- Hyomen Kagaku
Hyomen Kagaku 23(4), 209-214, 2002-04-10
The Surface Science Society of Japan