硝酸塩,硫酸塩などからのGa・1次イオンTOF-SIMSフラグメントパターン  [in Japanese] Inference of Ga-primary Ion TOF-SIMS Fragment Pattern of Nitrates and Sulfates  [in Japanese]

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Author(s)

Abstract

Gallium primary ion TOF-SIMS fragment patterns from some nitrates and sulfates can be qualitatively inferred. Considering the chemical parameters: valence and electron negativity (electron affinity) of cations and anions in fragments, the regularity of fragment pattern appearance behavior from some nitrates and sulfates could be inferred, but the effect of surface contaminants like water should be taken into consideration as in the case of halides and oxides.

Journal

  • Hyomen Kagaku

    Hyomen Kagaku 23(4), 209-214, 2002-04-10

    The Surface Science Society of Japan

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Codes

  • NII Article ID (NAID)
    10008008437
  • NII NACSIS-CAT ID (NCID)
    AN00334149
  • Text Lang
    JPN
  • Article Type
    ART
  • ISSN
    03885321
  • NDL Article ID
    6135225
  • NDL Source Classification
    ZM35(科学技術--物理学)
  • NDL Call No.
    Z15-379
  • Data Source
    CJP  NDL  J-STAGE 
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