蛍光体への低速電子線侵入深さの測定技術  [in Japanese] Measurement technique for penetration depth of low-energy electron into phosphors  [in Japanese]

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Author(s)

Journal

  • 應用物理

    應用物理 71(5), 571-575, 2002-05-10

    応用物理学会

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  • 光関連材料・デバイス  [in Japanese]

    高木 将実 , 田中 克 , 山田 明孝 , 竹内 博行 , 堀田 幸男 , 辻川 正弘 , 住友 三幸 , 新見 徳一 , 佐野 一広 , 鎌田 博士

    Journal of the Illuminating Engineering Institute of Japan 87(8), 635-642, 2003-08-01

    References (144)

Codes

  • NII Article ID (NAID)
    10008201078
  • NII NACSIS-CAT ID (NCID)
    AN00026679
  • Text Lang
    JPN
  • Article Type
    Journal Article
  • ISSN
    03698009
  • NDL Article ID
    6128029
  • NDL Source Classification
    ZM17(科学技術--科学技術一般--力学・応用力学)
  • NDL Call No.
    Z15-243
  • Data Source
    CJP  CJPref  NDL 
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