産業用X線CT技術の進展 : 高密度実装半導体および材料試験複合装置による応用  [in Japanese] Technological Progress of Industrial CT Scanner : Applications to Highly Integrated Semiconductor and CT System Combined with Material Testing Machine  [in Japanese]

Search this Article

Author(s)

Journal

  • Journal of JSEM

    Journal of JSEM 1(3), 127-131, 2001-10

    日本実験力学会

References:  6

Codes

  • NII Article ID (NAID)
    10008203534
  • NII NACSIS-CAT ID (NCID)
    AA11822914
  • Text Lang
    JPN
  • Article Type
    REV
  • ISSN
    13464930
  • NDL Article ID
    5941659
  • NDL Source Classification
    ZM17(科学技術--科学技術一般--力学・応用力学)
  • NDL Call No.
    Z74-C355
  • Data Source
    CJP  NDL 
Page Top