新しい機能を組み込んだ高分解能・超高真空電子顕微鏡の開発と金ナノワイヤー,ナノ薄膜の構造観察  [in Japanese] Development of ultrahigh resolution and ultrahigh vacuum electron microscope with new function  [in Japanese]

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Author(s)

    • 近藤 行人 KONDO Yukihito
    • 日本電子株式会社 Development of ultrahigh resolution and ultrahigh vacuum electron microscope with new function

Journal

  • Denshi kenbikyo

    Denshi kenbikyo 37(1), 2-6, 2002-03-30

    The Japanese Society of Microscopy

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Codes

  • NII Article ID (NAID)
    10008217159
  • NII NACSIS-CAT ID (NCID)
    AN00145000
  • Text Lang
    JPN
  • Article Type
    ART
  • ISSN
    04170326
  • NDL Article ID
    6142209
  • NDL Source Classification
    ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
  • NDL Call No.
    Z16-896
  • Data Source
    CJP  NDL  J-STAGE 
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