集束イオンビームを用いる透過型電子顕微鏡の試料加工  [in Japanese]

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Author(s)

Journal

  • ぶんせき

    ぶんせき 329, 274-274, 2002-05-05

References:  3

  • <no title>

    YAGUCHI T.

    Microsc., Microanal. 5, 365, 1999

    Cited by (1)

  • <no title>

    YAGUCHI T.

    Microsc., Microanal. 6, 218, 2000

    Cited by (2)

  • <no title>

    YAGUCHI T.

    Microsc., Microanal. 7, 287, 2001

    Cited by (2)

Codes

  • NII Article ID (NAID)
    10008440502
  • NII NACSIS-CAT ID (NCID)
    AN00222622
  • Text Lang
    JPN
  • Article Type
    SHO
  • ISSN
    03862178
  • Data Source
    CJP 
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