Surface and Edge Scatter Measurements of Diamond Cutting Tools

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Author(s)

Journal

  • Proc. JSPE Spring Meeting 2002, Tokyo Inst. of Technology, Tokyo, (2002)

    Proc. JSPE Spring Meeting 2002, Tokyo Inst. of Technology, Tokyo, (2002) 2002(1), 706, 2002-03-01

Cited by:  1

Codes

  • NII Article ID (NAID)
    10008501445
  • NII NACSIS-CAT ID (NCID)
    AN1018673X
  • Text Lang
    ENG
  • Article Type
    Proceedings
  • Data Source
    CJP  CJPref 
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