全面導電釉がいしの釉薬に関する実用化研究(その2)  [in Japanese] A practical study on semiconducting glaze for insulators(2nd report)  [in Japanese]

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Abstract

The semiconducting glaze insulator shows excellent performance under contaminated conditions. Basic characteristics of the semiconducting glaze for mass-production were reported in the previous report. The 2nd report describes its long-term characteristics and study results on how to improve them. The semiconducting glaze insulator sometimes suffers from surface roughening for longterm use under voltage application, which is called electrolytic corrosion. From the test results, the electrolytic corrosion was considered due to small discharge around wetted contaminants on the surface and thermal stress caused by leakage current flowing into the glaze. In addition, it was confirmed that the electrolytic corrosion could be improved by increasing amount of metal oxides (SnO<SUB>2</SUB> and Sb<SUB>2</SUB>O<SUB>3</SUB>) in the semiconducting glaze and by adding small amount of the other metal oxide (Nb<SUB>2</SUB>O<SUB>5</SUB>). The suspension insulators produced with the improved semiconducting glaze were subjected to the acceleration laboratory test. The test results showed good performance within permissible increase in impedance and no serious damage of the glaze. The laboratory test results were compared with the field test data and it was concluded that the said semiconducting glaze insulators could have sufficient lifetime.

Journal

  • IEEJ Transactions on Fundamentals and Materials

    IEEJ Transactions on Fundamentals and Materials 122(6), 610-615, 2002-06-01

    The Institute of Electrical Engineers of Japan

References:  5

Codes

  • NII Article ID (NAID)
    10008510273
  • NII NACSIS-CAT ID (NCID)
    AN10136312
  • Text Lang
    JPN
  • Article Type
    ART
  • ISSN
    03854205
  • NDL Article ID
    6174985
  • NDL Source Classification
    ZN31(科学技術--電気工学・電気機械工業)
  • NDL Call No.
    Z16-793
  • Data Source
    CJP  NDL  J-STAGE 
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