LEEM and PEEM : Laterally Resolved Surface Analysis  [in Japanese]

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Author(s)

    • BAUER Ernst
    • Department of Physics and Astronomy, Arizona State University

Journal

  • 表面科学

    表面科学 23(5), 261, 2002-05-10

Codes

  • NII Article ID (NAID)
    10008563395
  • NII NACSIS-CAT ID (NCID)
    AN00334149
  • Text Lang
    JPN
  • Article Type
    OTR
  • ISSN
    03885321
  • Data Source
    CJP 
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