無機化合物におけるGa^+1次イオンTOF-SIMSフラグメント・パターンの規則性  [in Japanese] Regularity of Ga^+ Primary Ion TOF-SIMS Fragment Pattern of Inorganic Compounds  [in Japanese]

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Author(s)

Journal

  • Journal of the Surface Science Society of Japan

    Journal of the Surface Science Society of Japan 23(5), 306-320, 2002-05-10

    日本表面科学会

References:  27

Codes

  • NII Article ID (NAID)
    10008563503
  • NII NACSIS-CAT ID (NCID)
    AN00334149
  • Text Lang
    JPN
  • Article Type
    ART
  • ISSN
    03885321
  • NDL Article ID
    6161188
  • NDL Source Classification
    ZM35(科学技術--物理学)
  • NDL Call No.
    Z15-379
  • Data Source
    CJP  NDL 
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