SCM-XAFS法による半導体表面顕微分光  [in Japanese] Microspectroscopy of Semiconductor Surfaces by SCM-XAFS Method  [in Japanese]

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Author(s)

Journal

  • Journal of the Surface Science Society of Japan

    Journal of the Surface Science Society of Japan 23(6), 374-380, 2002-06-10

    日本表面科学会

References:  14

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Codes

  • NII Article ID (NAID)
    10008563809
  • NII NACSIS-CAT ID (NCID)
    AN00334149
  • Text Lang
    JPN
  • Article Type
    ART
  • ISSN
    03885321
  • NDL Article ID
    6184723
  • NDL Source Classification
    ZM35(科学技術--物理学)
  • NDL Call No.
    Z15-379
  • Data Source
    CJP  NDL 
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