無機化合物のGa^+1次イオンTOF-SIMSフラグメント・パターン推定への同位体存在比導入の試み  [in Japanese] Consideration of Isotope Abundance in the Inference of Ga^+ Primary Ion TOF-SIMS Fragment Pattern of Inorganic Compounds  [in Japanese]

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Author(s)

Journal

  • Journal of the Surface Science Society of Japan

    Journal of the Surface Science Society of Japan 23(6), 389-394, 2002-06-10

    日本表面科学会

References:  3

  • <no title>

    李展平

    表面科学 21, 651, 2001

    Cited by (1)

  • <no title>

    HIROKAWA K.

    Fresenius J. Anal. Chem. 370, 346, 2001

    Cited by (1)

  • <no title>

    李展平

    表面科学 23, 209, 2002

    Cited by (3)

Codes

  • NII Article ID (NAID)
    10008563849
  • NII NACSIS-CAT ID (NCID)
    AN00334149
  • Text Lang
    JPN
  • Article Type
    NOT
  • ISSN
    03885321
  • NDL Article ID
    6184755
  • NDL Source Classification
    ZM35(科学技術--物理学)
  • NDL Call No.
    Z15-379
  • Data Source
    CJP  NDL 
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