MT and control source modeling algorithms for 3D media with topography and large resistivity contrasts
収録刊行物
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- The second International symposium on Three-Dimensional Electromagnetics (3DEM-2)
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The second International symposium on Three-Dimensional Electromagnetics (3DEM-2) 21-24, 1999
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詳細情報
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- CRID
- 1573387449477460608
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- NII論文ID
- 10008600262
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- データソース種別
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- CiNii Articles