走査型近接場光学顕微鏡による半導体量子ナノ構造の物性計測  [in Japanese] Scanning near-field optical spectroscopy for semiconductor quantum nano-structures  [in Japanese]

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Author(s)

Journal

  • 應用物理

    應用物理 71(6), 714-715, 2002-06-10

References:  7

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    斎木敏治

    応用物理 68, 313, 1999

    Cited by (2)

Codes

  • NII Article ID (NAID)
    10008644026
  • NII NACSIS-CAT ID (NCID)
    AN00026679
  • Text Lang
    JPN
  • Article Type
    NOT
  • ISSN
    03698009
  • Data Source
    CJP 
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