電子顕微鏡入門講座(中級編)透過電子顕微鏡の先進機能をもっと活用しよう(1)収束電子回折(CBED)法の基礎 [in Japanese] Fundamentals of Convergent Beam Electron Diffraction [in Japanese]
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Fundamentals of convergent-beam electron diffraction (CBED) are described. First, the CBED method is explained and an obtained CBED pattern is shown. Then, it is described what kind of crystallographic information can be obtained by the CBED method. The characteristic profiles of higher order Laue zone (HOLZ) reflections are explained by the dynamical diffraction effect. The large angle (LACBED) technique and its application to identify the types of dislocations are given. The coherence effect appearing at the overlapping regions of two CBED disks is explained.
- Nihon Kessho Gakkaishi
Nihon Kessho Gakkaishi 44(3), 150-160, 2002-06-28
The Crystallographic Society of Japan