電子顕微鏡入門講座(中級編)透過電子顕微鏡の先進機能をもっと活用しよう(1)収束電子回折(CBED)法の基礎  [in Japanese] Fundamentals of Convergent Beam Electron Diffraction  [in Japanese]

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Author(s)

Abstract

Fundamentals of convergent-beam electron diffraction (CBED) are described. First, the CBED method is explained and an obtained CBED pattern is shown. Then, it is described what kind of crystallographic information can be obtained by the CBED method. The characteristic profiles of higher order Laue zone (HOLZ) reflections are explained by the dynamical diffraction effect. The large angle (LACBED) technique and its application to identify the types of dislocations are given. The coherence effect appearing at the overlapping regions of two CBED disks is explained.

Journal

  • Nihon Kessho Gakkaishi

    Nihon Kessho Gakkaishi 44(3), 150-160, 2002-06-28

    The Crystallographic Society of Japan

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Codes

  • NII Article ID (NAID)
    10008687312
  • NII NACSIS-CAT ID (NCID)
    AN00188364
  • Text Lang
    JPN
  • Article Type
    REV
  • ISSN
    03694585
  • NDL Article ID
    6199808
  • NDL Source Classification
    ZM46(科学技術--地球科学--岩石・鉱物・鉱床)
  • NDL Call No.
    Z15-138
  • Data Source
    CJP  NDL  J-STAGE 
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