改良イオンビーム ・ スパッタ法による高分解能走査電子顕微鏡(HRSEM)観察のための試料作成  [in Japanese] Sample Preparation for Observation with High Resolution Scanning Electron Microscope(HRSEM) by Ion-beam Sputter Coating  [in Japanese]

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Author(s)

Journal

  • Journal of the Mineralogical Society of Japan

    Journal of the Mineralogical Society of Japan 28(2), 65-69, 1999-05-01

    日本鉱物学会

References:  9

Codes

  • NII Article ID (NAID)
    10008770086
  • NII NACSIS-CAT ID (NCID)
    AN00084868
  • Text Lang
    JPN
  • Article Type
    NOT
  • ISSN
    04541146
  • NDL Article ID
    4744638
  • NDL Source Classification
    ZM46(科学技術--地球科学--岩石・鉱物・鉱床)
  • NDL Call No.
    Z15-117
  • Data Source
    CJP  NDL 
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