Grain boundary phase analysis of silicon nitride by a newly developed 300 kV field-emission electron microscope

• BANDO Y.

Journal

• Mater Res Soc Symp Proc

  Mater Res Soc Symp Proc 346 733-738, 1993

Details

• CRID: 1570291224754090752
• NII Article ID: 10008808782
• Data Source:
  • CiNii Articles