Determination of the displacement vector at a stacking fault using convergent-beam electron diffraction

• TANAKA M.

収録刊行物

• Proc 5th Asia-Pacifis Electron Microsc Conf

  Proc 5th Asia-Pacifis Electron Microsc Conf 154-157, 1992

詳細情報

• CRID: 1571417124660920448
• NII論文ID: 10008808942
• データソース種別:
  • CiNii Articles