Kramers-Kronig Analysis of a-Si/SiNx Interface Structure
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- Houjou Hirohiko HOUJOU Hirohiko
- Toray Reserch Center, Inc., Morphological Laboratory
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- OTSUKA Yuji
- Toray Reserch Center, Inc., Morphological Laboratory
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- TANII Yoshiharu
- Toray Reserch Center, Inc., Morphological Laboratory
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- HINOSHITA Chiaki
- Toray Reserch Center, Inc., Morphological Laboratory
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- HORII Seiichirou
- Toray Reserch Center, Inc., Morphological Laboratory
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- MURATA Yukio
- Toray Reserch Center, Inc., Morphological Laboratory
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Author(s)
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- Houjou Hirohiko HOUJOU Hirohiko
- Toray Reserch Center, Inc., Morphological Laboratory
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- OTSUKA Yuji
- Toray Reserch Center, Inc., Morphological Laboratory
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- TANII Yoshiharu
- Toray Reserch Center, Inc., Morphological Laboratory
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- HINOSHITA Chiaki
- Toray Reserch Center, Inc., Morphological Laboratory
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- HORII Seiichirou
- Toray Reserch Center, Inc., Morphological Laboratory
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- MURATA Yukio
- Toray Reserch Center, Inc., Morphological Laboratory
Journal
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- Journal of Electron Microscopy
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Journal of Electron Microscopy 44(5), 414-418, 1995-10-01
Published for the Japanese Society of Electron Microscopy by Oxford University Press
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