The use of electron diffraction in the determination of the polarity of II-Vi and III-V semiconductors

• SPELLWARD P.

収録刊行物

• EMAG '91

  EMAG '91 375-378, 1991

  I.O.P. Publishing

詳細情報

• CRID: 1571698599611357696
• NII論文ID: 10008811528
• データソース種別:
  • CiNii Articles