Studies on the SEM examination of un-coated non-conductive specimens prepared by plasma-ion shower method

• Hiroshi Akahori

• Hisaharu Yoshida

• Yuri Amakawa

Bibliographic Information

Other Title

• Studies on the SEM examination of un-co

Journal

• Journal of electron microscopy

  Journal of electron microscopy 46 (6), 457-466, 1997-12

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Details

• CRID: 1522543654997316864
• NII Article ID: 10008812418
• NII Book ID: AA00697060
• ISSN: 00220744
• NDL BIB ID: 4406341
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4406341
• Text Lang: en
• NDL Source Classification:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• Data Source:
  • NDL
  • CiNii Articles