An aberration-free imaging technique based on focal depth extension

• Takashi Ikuta

Bibliographic Information

Other Title

• aberration-free imaging technique based on focal depth extension

Journal

• Journal of electron microscopy

  Journal of electron microscopy 47 (5), 427-432, 1998-10

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Details

• CRID: 1521136280084536192
• NII Article ID: 10008813366
• NII Book ID: AA00697060
• ISSN: 00220744
• NDL BIB ID: 4670569
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4670569
• Text Lang: en
• NDL Source Classification:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• Data Source:
  • NDL
  • CiNii Articles