Protable scanning electron microscope designs
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- Khursheed A. KHURSHEED A.
- The Centre for Integrated Circuit Failure Analysis and Reliability (CICFAR), Electrical Engineering Department, National University of Singapore
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著者
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- Khursheed A. KHURSHEED A.
- The Centre for Integrated Circuit Failure Analysis and Reliability (CICFAR), Electrical Engineering Department, National University of Singapore
収録刊行物
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- Journal of electron microscopy
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Journal of electron microscopy 47(6), 591-602, 1998-12-01
Published for the Japanese Society of Electron Microscopy by Oxford University Press
参考文献: 7件中 1-7件 を表示
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1
- A portable scanning electron microscope columu design based upon the use of permanent magnets
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KHUESHEED A.
Scanning 20, 87-91, 1998
被引用文献1件
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2
- <no title>
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HAWKER P. W.
Magnetic Electron Lenses, 302-322, 1982
被引用文献1件
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3
- <no title>
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LHURSHEED A.
KEOS: Khursheed Electron Optics Software, 1992
被引用文献1件
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4
- In-lens defectors for a LVSEM magnetic immersion objective lens
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ZHAO Y.
Proc. SPIE, Charged Particle Optics III 3155, 37-46, 1997
被引用文献1件
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5
- <no title>
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THONG J. T. L.
Electron Beam Testing Technology, 213-218, 1993
被引用文献1件
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6
- <no title>
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HAWKES P. W.
Magnetic Electron Lenses 233, 1982
被引用文献1件
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7
- <no title>
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REIMER L.
Image Formation in Low Voltage Scanning Electron Microscopy. Tutorial Texts, (SPIE) Chater 1, 1993
被引用文献1件