High-voltage, high-resolution electron microscopy study on thin sections of phase change optical disk prepared by an ultramicrotome

• Gyeong-Su Park

• Hyeon-Chang Hong

• Jun-Mo Yang

書誌事項

タイトル別名

• High-voltage high-resolution electron microscopy study on thin sections of phase change optical disk prepared by an ultramicrotome

収録刊行物

• Journal of electron microscopy

  Journal of electron microscopy 48 (3), 183-190, 1999

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

詳細情報

• CRID: 1520573330937004032
• NII論文ID: 10008814614
• NII書誌ID: AA00697060
• ISSN: 00220744
• NDL書誌ID: 4756755
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4756755
• 本文言語コード: en
• NDL 雑誌分類:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• データソース種別:
  • NDL
  • CiNii Articles