On the application of the weak-beam technique to the determination of the sizes of small point-defect clusters in ion-irradiated copper

• Michael L. Jenkins

• Marquis A. Kirk

• Hiroshi Fukushima

Journal

• Journal of electron microscopy

  Journal of electron microscopy 48 (4), 323-332, 1999

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Details

• CRID: 1524232505702185216
• NII Article ID: 10008814969
• NII Book ID: AA00697060
• ISSN: 00220744
• NDL BIB ID: 4835461
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4835461
• Text Lang: en
• NDL Source Classification:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• Data Source:
  • NDL
  • CiNii Articles