High-resolution electron microscopy study of defect structures in γ-TiAl irradiated with 15 keV He ions in a high-voltage transmission electron microscope

書誌事項

タイトル別名
  • High-resolution electron microscopy study of defect structures in ガンマ TiAl irradiated with 15 keV He ions in a high-voltage transmission electron microscope

この論文をさがす

収録刊行物

  • Journal of electron microscopy

    Journal of electron microscopy 48 (4), 355-360, 1999

    Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

参考文献 (13)*注記

もっと見る

詳細情報

問題の指摘

ページトップへ