High-resolution electron microscopy study of defect structures in γ-TiAl irradiated with 15 keV He ions in a high-voltage transmission electron microscope
書誌事項
- タイトル別名
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- High-resolution electron microscopy study of defect structures in ガンマ TiAl irradiated with 15 keV He ions in a high-voltage transmission electron microscope
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収録刊行物
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- Journal of electron microscopy
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Journal of electron microscopy 48 (4), 355-360, 1999
Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press
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詳細情報
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- CRID
- 1521699230766134528
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- NII論文ID
- 10008815022
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- NII書誌ID
- AA00697060
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- ISSN
- 00220744
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- NDL書誌ID
- 4835519
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- 本文言語コード
- en
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- NDL 雑誌分類
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- ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
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- データソース種別
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- NDL
- CiNii Articles