New specimen preparation methods for materials transmission electron microscopy, using ion-milling.

• KAWASAKI M.

収録刊行物

• Electron Technol.

  Electron Technol. 31 183-188, 1998

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• CRID: 1573387449471997440
• NII論文ID: 10008815051
• データソース種別:
  • CiNii Articles