In-situ,analytical,high-voltage and high-resolution transmission electron microscopy of Xe ion implantation into Al

• Kazuo Furuya

• Kazutaka Mitsuishi

• Minghui Song

書誌事項

タイトル別名

• In-situ analytical high-voltage and high-resolution transmission electron microscopy of Xe ion implantation into Al

収録刊行物

• Journal of electron microscopy

  Journal of electron microscopy 48 (5), 511-518, 1999

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

詳細情報

• CRID: 1521136279901407232
• NII論文ID: 10008815370
• NII書誌ID: AA00697060
• ISSN: 00220744
• NDL書誌ID: 4895037
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4895037
• 本文言語コード: en
• NDL 雑誌分類:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• データソース種別:
  • NDL
  • CiNii Articles