New fullerenes in the B-C-N system:synthesis and analysis by an electron beam

• Dmitri Golberg

• Yoshio Bando

• Odile Stephan

書誌事項

タイトル別名

• New fullerenes in the B-C-N system synthesis and analysis by an electron beam
• HAFN Special Issue
• HAFN Special Issue

収録刊行物

• Journal of electron microscopy

  Journal of electron microscopy 48 (6), 701-709, 1999

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

詳細情報

• CRID: 1524232505352255872
• NII論文ID: 10008815890
• NII書誌ID: AA00697060
• ISSN: 00220744
• NDL書誌ID: 4976604
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4976604
• 本文言語コード: en
• NDL 雑誌分類:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• データソース種別:
  • NDL
  • CiNii Articles