Electron beam-induced transformations: application to fullerene and nanotube technology

• GOLBERG D.

Journal

• Proceedings of the 14th International Congress on Electron Microscopy

  Proceedings of the 14th International Congress on Electron Microscopy 85-87, 1998

  Cancun

Details

• CRID: 1574231874402084992
• NII Article ID: 10008815933
• Data Source:
  • CiNii Articles