Failure analysis of laser diodes by SEM and TEM

• Yasufumi Yabuuchi

• Sachiko Inazato

Bibliographic Information

Other Title

• HAFN Special Issue
• HAFN Special Issue

Journal

• Journal of electron microscopy

  Journal of electron microscopy 48 (6), 791-794, 1999

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Details

• CRID: 1523106605542573824
• NII Article ID: 10008816092
• NII Book ID: AA00697060
• ISSN: 00220744
• NDL BIB ID: 4976671
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4976671
• Text Lang: en
• NDL Source Classification:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• Data Source:
  • NDL
  • CiNii Articles