Improvement of resolution by maximum entropy linear image restoration for NiSi2/Si interface

• Fu-Rong Chen

• J.J. Kai

• L. Chang

Bibliographic Information

Other Title

• Improvement of resolution by maximum entropy linear image restoration for NiSi2 Si interface

Journal

• Journal of electron microscopy

  Journal of electron microscopy 48 (6), 827-836, 1999

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Details

• CRID: 1520291855775691648
• NII Article ID: 10008816205
• NII Book ID: AA00697060
• ISSN: 00220744
• NDL BIB ID: 4976687
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4976687
• Text Lang: en
• NDL Source Classification:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• Data Source:
  • NDL
  • CiNii Articles