Development of a real-time defocus-image modulation processing electron microscope. II. Dynamic observation of spherical aberration-free phase image of surface atoms

Search this Article

Author(s)

Journal

  • Journal of Electron Microscopy

    Journal of Electron Microscopy 48(6), 879-885, 1999-12-01

    Published for the Japanese Society of Electron Microscopy by Oxford University Press

References:  13

Cited by:  1

Codes

  • NII Article ID (NAID)
    10008816321
  • NII NACSIS-CAT ID (NCID)
    AA00697060
  • Text Lang
    ENG
  • Article Type
    Journal Article
  • ISSN
    00220744
  • NDL Article ID
    4976717
  • NDL Source Classification
    ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
  • NDL Call No.
    Z53-T76
  • Data Source
    CJP  CJPref  NDL 
Page Top