Atomic displacements in the modulated structure of Bi2Sr2(Ca1-xPrx)Cu2O8+δ and their effect on HRTEM reverse contrast image

• Takashi Onozuka

• Sigemaro Nagakura

書誌事項

タイトル別名

• Atomic displacements in the modulated structure of Bi2Sr2 Ca1 xPrx Cu2O8 デルタ and their effect on HRTEM reverse contrast image

収録刊行物

• Journal of electron microscopy

  Journal of electron microscopy 49 (1), 149-155, 2000

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

キーワード

• contrast modulation
• atomic displacement wave
• phase difference
• Bi2Sr2(Ca0.96Pr0.04)Cu2O8+δ

詳細情報

• CRID: 1522543655531169664
• NII論文ID: 10008817257
• NII書誌ID: AA00697060
• ISSN: 00220744
• NDL書誌ID: 5315949
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I5315949
• 本文言語コード: en
• NDL 雑誌分類:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• データソース種別:
  • NDL
  • CiNii Articles