Development of Microstructure Control of Materials with Progress of Crystallographic Orientation Analysis

• SUGIYAMA Masaaki

  Materials Characterization Research Laboratory, Advanced Technology Research Laboratories. Nippon Steel Corporation

Bibliographic Information

Other Title

• 小特集企画にあたって

Journal

• まてりあ : 日本金属学会会報

  まてりあ : 日本金属学会会報 40 (7), 611-, 2001-07-20

Keywords

• electron back scattering pattern (EBSP)
• crystallographic orientation
• Kikuchi-line diffraction
• field emission-scanning electron microscopy (FE-SEM)
• transmission electron microscopy (TEM)
• microstructure
• grain boundary
• deformation texture
• recysstallization

Details

• CRID: 1573950399402913152
• NII Article ID: 10008846351
• NII Book ID: AN10433227
• ISSN: 13402625
• Text Lang: ja
• Data Source:
  • CiNii Articles