Sio_2/Si 界面構造の原子スケール直接観察  [in Japanese] Atomic Structure at a SiO_2./Si Interface  [in Japanese]

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Author(s)

Journal

  • Materia Japan

    Materia Japan 40(12), 996, 2001-12-20

    The Japan Institute of Metals and Materials

References:  3

  • <no title>

    IKARASHI N.

    Jpn. J. Appl. Phys. 39, 1278, 2000

    Cited by (2)

  • <no title>

    IKARASHI N.

    Phys. Rev. B 62, 15989-15995, 2000

    DOI  Cited by (10)

  • <no title>

    IKARASHI N.

    J. Appl. Phys. 90, 2683, 2001

    DOI  Cited by (5)

Codes

  • NII Article ID (NAID)
    10008847771
  • NII NACSIS-CAT ID (NCID)
    AN10433227
  • Text Lang
    JPN
  • Article Type
    REV
  • ISSN
    13402625
  • Data Source
    CJP  J-STAGE 
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