埋め込み型 LD における歪量子井戸活性層の格子定数測定  [in Japanese] Lattice Parameter Measurement of Strained Layer Multiple Quantum Well in Buried Laser Diode  [in Japanese]

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Author(s)

Journal

  • Materia Japan

    Materia Japan 40(12), 1006, 2001-12-20

    The Japan Institute of Metals and Materials

References:  1

  • <no title>

    村山慶人

    電子顕微鏡 36 Supplement 1, 45, 2001

    Cited by (1)

Codes

  • NII Article ID (NAID)
    10008847801
  • NII NACSIS-CAT ID (NCID)
    AN10433227
  • Text Lang
    JPN
  • Article Type
    REV
  • ISSN
    13402625
  • Data Source
    CJP  J-STAGE 
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