Si 結晶中に埋め込まれた FeSi_2 のTEM観察  [in Japanese] Structure Analysis of FeSi_2 Embeded in Si by Transmission Electron Microscopy  [in Japanese]

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Author(s)

Journal

  • Materia Japan

    Materia Japan 40(12), 1013, 2001-12-20

    The Japan Institute of Metals and Materials

References:  3

  • <no title>

    SUEMASU T.

    Jpn. J. Appl. Phys. 39, L1013, 2000

    Cited by (30)

  • <no title>

    SUEMASU T.

    Appl. Phys. Lett. 79, 1804, 2001

    Cited by (9)

  • <no title>

    CLARK S. J.

    Phys. Rev., B 58, 10389, 1998

    Cited by (7)

Codes

  • NII Article ID (NAID)
    10008847822
  • NII NACSIS-CAT ID (NCID)
    AN10433227
  • Text Lang
    JPN
  • Article Type
    REV
  • ISSN
    13402625
  • Data Source
    CJP  J-STAGE 
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