半導体セラミックス材料の粒界観察  [in Japanese] Grain Boundary Observation of Semi-conducting Ceramic Material  [in Japanese]

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Author(s)

Journal

  • Materia Japan

    Materia Japan 40(12), 1037, 2001-12-20

    The Japan Institute of Metals and Materials

References:  2

  • <no title>

    WAKU S.

    Rev. Elec. Commun. Lab. 19, 665, 1971

    Cited by (1)

  • <no title>

    KAWASAKI M.

    Philos. Mag. A 81, 245, 2001

    Cited by (1)

Codes

  • NII Article ID (NAID)
    10008847894
  • NII NACSIS-CAT ID (NCID)
    AN10433227
  • Text Lang
    JPN
  • Article Type
    REV
  • ISSN
    13402625
  • Data Source
    CJP  J-STAGE 
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