光電子回折による半導体表面構造解析  [in Japanese] Structural analyses of semiconductor surfaces by photoelectron diffraction  [in Japanese]

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Author(s)

Journal

  • 應用物理

    應用物理 69(10), 1157-1166, 2000-10-10

    応用物理学会

References:  50

Cited by:  1

Codes

  • NII Article ID (NAID)
    10008978999
  • NII NACSIS-CAT ID (NCID)
    AN00026679
  • Text Lang
    JPN
  • Article Type
    Journal Article
  • ISSN
    03698009
  • NDL Article ID
    5496960
  • NDL Source Classification
    ZM17(科学技術--科学技術一般--力学・応用力学)
  • NDL Call No.
    Z15-243
  • Data Source
    CJP  CJPref  NDL 
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