カソードルミネッセンス観測による薄膜・表面局所構造と光物性  [in Japanese] TEM-cathodoluminescence studies on nanostructures and optical properties of thin films and surfaces  [in Japanese]

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Author(s)

Journal

  • 應用物理

    應用物理 69(10), 1167-1173, 2000-10-10

    応用物理学会

References:  30

  • <no title>

    MUIR M. D.

    Quantitative Scanning Electron Microscopy Ch9, 1974

    Cited by (1)

  • <no title>

    PETROFF P. M.

    SEM 1978 1, 325, 1978

    Cited by (1)

  • <no title>

    関口隆史

    応用物理 65, 491, 1996

    Cited by (3)

  • <no title>

    山本直紀

    日本結晶学会誌 27, 12, 1985

    Cited by (4)

  • <no title>

    関口隆史

    電子顕微鏡 33, 186, 1998

    Cited by (2)

  • <no title>

    GOLDSTEIN J. I.

    Introduction to Analytical Electron Microscopy 83, 1979

    Cited by (2)

  • <no title>

    YACOBI B. G.

    J. Appl. Phys. 59, R1, 1986

    Cited by (6)

  • <no title>

    YAMAMOTO N.

    Philos. Mag. B 49, 609, 1984

    Cited by (3)

  • <no title>

    SEKIGUCHI T.

    J. Appl. Phys. 79, 3253, 1996

    Cited by (3)

  • <no title>

    MITSUI T.

    Proc. Intern. Cong. Electron Microsc. 1, 455, 1998

    Cited by (1)

  • <no title>

    RAMMONHAN K.

    Phys. Rev. B 51, 5033, 1995

    Cited by (1)

  • <no title>

    TANG Y.

    J. Appl. Phys. 76, 3032, 1994

    Cited by (1)

  • <no title>

    POLLAK F. H.

    Phys. Rev. 172, 816, 1968

    Cited by (11)

  • <no title>

    YAMAMOTO N.

    Mat. Res. Soc. Symp. Proc. 588, 245, 2000

    Cited by (1)

  • <no title>

    GINZBURG V. L.

    JETP(USSR) 16, 15, 1946

    Cited by (1)

  • <no title>

    GINZBURG V. L.

    J. Phys. 9, 353, 1946

    Cited by (1)

  • <no title>

    TER-MIKAELIAN M. L.

    High-energy electromagnetic processes in condenced media, 1972

    Cited by (1)

  • <no title>

    YAMAMOTO N.

    Proc. Roy. Soc. Lond. A 452, 2279, 1996

    Cited by (1)

  • <no title>

    GARCIA F. J.

    Phys. Rev. B 59, 3095, 1999

    Cited by (1)

  • <no title>

    COOMBS J. H.

    J. Microsc. 152, 325, 1998

    Cited by (2)

  • <no title>

    ALVARADO S. F.

    J. Vac. Sci. Technol. B 9, 409, 1991

    Cited by (3)

  • <no title>

    PFISTER M.

    Appl.Phys.Lett. 65, 1168, 1994

    Cited by (3)

  • <no title>

    EVOY S.

    J. Vac. Sci. Technol. B 17, 29, 1999

    Cited by (1)

  • <no title>

    青野正和

    応用物理 67, 1361, 1998

    Cited by (4)

  • <no title>

    UEHARA Y.

    Appl. Surf. Sci. 107, 247, 1996

    Cited by (1)

  • <no title>

    BERNDT R.

    Phys. Rev. B 48, 4746, 1993

    Cited by (1)

  • <no title>

    DOWNES A.

    Phys.Rev.Lett. 81, 1857, 1998

    Cited by (7)

  • <no title>

    SUZUKI Y.

    Surf. Sci. 438, 297, 1999

    Cited by (3)

  • <no title>

    MITSUI T.

    J.Appl.Phys. 80, 6972, 1996

    DOI  Cited by (5)

  • <no title>

    MYHAJLENKO S.

    J.Phys. C 17, 6477, 1984

    DOI  Cited by (2)

Codes

  • NII Article ID (NAID)
    10008979050
  • NII NACSIS-CAT ID (NCID)
    AN00026679
  • Text Lang
    JPN
  • Article Type
    REV
  • ISSN
    03698009
  • NDL Article ID
    5496978
  • NDL Source Classification
    ZM17(科学技術--科学技術一般--力学・応用力学)
  • NDL Call No.
    Z15-243
  • Data Source
    CJP  NDL 
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