光を使った表面・界面の観測 : -反射率差分光の物理-  [in Japanese] Optical characterization of surfaces and inerfaces : Physics of reflectance difference spectroscopy  [in Japanese]

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Author(s)

Journal

  • 應用物理

    應用物理 69(10), 1210-1214, 2000-10-10

    応用物理学会

References:  10

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    中山隆史

    「極薄シリコン酸化膜の形成 評価 信頼性」第5回研究会報告 237, 2000

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    DOI  Cited by (10)

Codes

  • NII Article ID (NAID)
    10008979218
  • NII NACSIS-CAT ID (NCID)
    AN00026679
  • Text Lang
    JPN
  • Article Type
    REV
  • ISSN
    03698009
  • NDL Article ID
    5497413
  • NDL Source Classification
    ZM17(科学技術--科学技術一般--力学・応用力学)
  • NDL Call No.
    Z15-243
  • Data Source
    CJP  NDL 
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