X線回折による有機超薄膜の構造評価  [in Japanese] Structure analysis for organic thin films by grazing incidence x-ray diffraction.  [in Japanese]

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Author(s)

Journal

  • 應用物理

    應用物理 69(12), 1441-1442, 2000-12-10

References:  9

  • <no title>

    ALS-NIELSEN J.

    Phys. Rep. 246, 251, 1994

    Cited by (5)

  • <no title>

    吉田郵司

    表面科学 18, 178, 1997

    Cited by (1)

  • <no title>

    石田謙司

    表面科学 19, 259, 1998

    Cited by (1)

  • <no title>

    表和彦

    X線分析の進歩 30, 165, 1999

    Cited by (5)

  • <no title>

    表和彦

    X線分析の進歩 30, 205, 1999

    Cited by (3)

  • <no title>

    TONY M. F.

    Nature 374, 709, 1995

    Cited by (3)

  • <no title>

    FACTOR B. J.

    Macromolecules 26, 2847, 1993

    Cited by (4)

  • <no title>

    KOJIO K.

    Langmuir 16, 3932, 2000

    DOI  Cited by (6)

  • <no title>

    KOJIO K.

    Langmuir 14, 971, 1998

    DOI  Cited by (8)

Codes

  • NII Article ID (NAID)
    10008979964
  • NII NACSIS-CAT ID (NCID)
    AN00026679
  • Text Lang
    JPN
  • Article Type
    NOT
  • ISSN
    03698009
  • Data Source
    CJP 
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