Theoretical Foundation for Residual Lifetime Estimation

• Hirose Hideo

  Hiroshima City University

書誌事項

タイトル別名

• Theoretical Foundation for Residual Lif

抄録

This paper shows a method, in the Weibull-power model, of estimating the parameters and the residual lifetime of insulation which had been under the specified service voltage stress for a long period. The deterioration model is assumed to include a threshold stress below which a breakdown will not occur. When a presumptive threshold is higher than the service voltage stress, the insulation will not deteriorate at all. In such a case, a hypothesis test which determines whether the threshold is higher than the service stress is shown ; the test can also support the existence of a strictly positive threshold. These methods will be applicable to the residual lifetime analysis for cross-linked polyethylene insulated cables which had been used for decades. Some simulated examples are demonstrated.

収録刊行物

• 電気学会論文誌Ｂ（電力・エネルギー部門誌）

  電気学会論文誌Ｂ（電力・エネルギー部門誌） 116 (2), 168-173, 1996

  一般社団法人 電気学会

キーワード

• Weibull-power model
• Residual lifetime
• Threshold stress
• Accelerated life-test
• Step-stress test
• Maximum likelihood estimation

詳細情報

• CRID: 1390001204606448128
• NII論文ID: 130006842525
• NII論文ID: 10009872260
• NII書誌ID: AN10136334
• DOI: 10.1541/ieejpes1990.116.2_168
• ISSN: 13488147
• ISSN: 03854213
• ISSN: http://id.crossref.org/issn/03854213
• NDL書誌ID: 3925970
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I3925970
• Web Site: https://www.jstage.jst.go.jp/article/ieejpes1990/116/2/116_2_168/_pdf
• 本文言語コード: en
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可