Crystal Structure and Ferroelectric Property of Tungsten-substituted Bi<sub>4</sub>Ti<sub>3</sub>O<sub>12</sub>Thin Films Prepared by Metal-Organic Chemical Vapor Deposition

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  • Crystal Structure and Ferroelectric Property of Tungsten-substituted Bi4Ti3O12 Thin Films Prepared by Metal-Organic Chemical Vapor Deposition

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W-substituted Bi4Ti3O12 (BIT), Bi4(Ti3−xWx)O12, films were prepared on (111)Pt/IrO2/SiO2/Si substrates at 600°C by metal-organic chemical vapor deposition (MOCVD). The degree of (117) orientation and the lattice spacing of 117 Bi4(Ti3−xWx)O12 increased with increasing W content up to x=0.25. Ferroelectricity was hardly observed in as-deposited films but confirmed in the films after annealing at 700°C. The coercive field (Ec) monotonically increased with increasing W content, but the remanent polarization (Pr) showed a maximum value at x=0.11. Pr and Ec of Bi4(Ti2.89W0.11)O12 thin film after heat treatment was 13 μC/cm2 and 160 kV/cm, respectively. W-substituted films showed high fatigue resistance against continuous switching up to 8×1010 cycles. These results show that W substitution for BIT film is effective in improving the ferroelectricity.

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