書誌事項
- タイトル別名
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- The influence of the argon ion beam etching on the structure of the various set bonding resins
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The aim of this study was to observe the topographical changes of the seven kinds of set bonding resin surfaces after the argon ion beam etching, examining the hardness of the set bonding resin surfaces. Each kind of the bonding resins was light cured sufficiently in the accessory dish, embedded in an epoxy resin, and polished. Nano-hardness of the resin surfaces were measured with the nano-indentation tester. Then, the polished surfaces of each of the set bonding resins were observed under the FE-SEM. After subjected to the argon ion beam etching, the surfaces were observed again and compared with the polished surface image. The hardness value of the bonding resins containing filler particles were higher than those without filler particles, and the resin surfaces of the two-step type systems were harder than the one-step type resins. The argon ion beam etching induced identical topographical changes for the individual bonding resin. It was considered that these changes were related to the filler loadings and the kinds or compositions of the monomer employed in the bonding resins, but not correlated with the hardness of the surface.
収録刊行物
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- 接着歯学
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接着歯学 21 (1), 7-16, 2003
日本接着歯学会
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詳細情報 詳細情報について
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- CRID
- 1390282679326827264
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- NII論文ID
- 130004047953
- 10010747292
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- NII書誌ID
- AN10044236
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- ISSN
- 21859566
- 09131655
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可
