Electron Emission Characteristic from Pb(Zr,Ti)O₃Thin Plate by Infrared Light Irradiation

• Takamuro Daisuke

  Department of Electrical and Electronic Engineering, Toyohashi University of Technology

• Takao Hidekuni

  Department of Electrical and Electronic Engineering, Toyohashi University of Technology

• Sawada Kazuaki

  Department of Electrical and Electronic Engineering, Toyohashi University of Technology

• Ishida Makoto

  Department of Electrical and Electronic Engineering, Toyohashi University of Technology

書誌事項

タイトル別名

• Electron Emission Characteristic from Pb(Zr,Ti)O3 Thin Plate by Infrared Light Irradiation

抄録

A new electron-emission-type infrared light sensor, which uses the principle of electron emission from a Pb(Zr,Ti)O₃ (PZT) thin plate, has been proposed. However, the electron supply route to the emission plane is not yet well understood. As pulsed infrared light was irradiated onto the sensor, the emission current increased rapidly and decreased slowly. The emission current peak value did not change during the continuous detection operation. When the infrared light is shielded, electron emission stops, the temperature of the PZT thin plate returns to the initial state, and an electric field appears due to spontaneous polarization. It is assumed that electrons are supplied through the PZT thin plate from the back-surface electrode to the emission plane via this electric field. In the pulsed infrared light irradiation experiment, we could recognize that the emission current peak value does not depend on the light shielding time. An electron supply model from the back-surface electrode through the PZT thin plate during a detection operation is proposed. In a quasi steady or thermal equilibrium state, the electron supply to the emission plane of the PZT thin plate is sufficient for a detection operation under ordinary irradiation conditions. Therefore, the proposed sensor is viable for use as an infrared sensor or imager under ordinary infrared light irradiation.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 42 (9A), 5741-5746, 2003

  The Japan Society of Applied Physics

キーワード

• infrared imager
• electron-emission-type
• electron supply
• ferroelectric
• pyroelectric
• PZT

詳細情報

• CRID: 1390001206264862848
• NII論文ID: 10011614898
• NII論文ID: 210000054133
• NII書誌ID: AA10457675
• DOI: 10.1143/jjap.42.5741
• ISSN: 13474065
• ISSN: 00214922
• NDL書誌ID: 6685665
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I6685665
• Web Site: http://stacks.iop.org/1347-4065/42/i=9R/a=5741/pdf
• 本文言語コード: en
• データソース種別:
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