Mn-N化合物薄膜の電子状態密度のXPS測定

• 森尾 和正

  東海大学大学院工学研究科

• 小泉 義晴

  東海大学大学院工学研究科

書誌事項

タイトル別名

• Electronic Density of State of Mn-N Thin Films Measured by XPS
• Mn N カゴウブツ ハクマク ノ デンシ ジョウタイ ミツド ノ XPS ソクテイ

抄録

Polycrystalline thin films with an oriented direction of ε-Mn₄N along the (111) axis and of η-Mn₃N₂ along the (113) axis were prepared as a single phase by RF reactive magnetron sputtering method. A comparison of XPS spectral analysis with discrete Variational-Xα method showed that the N atoms in Mn-N compounds behave as a donor and govern the magnetic properties of the films. The ε-Mn₄N films was a single phase perovskait type crystal with lattice parameter 0.386 nm, and this films had properties of the ferrimagnetism with 1.1 μ_B per unit cell. The η-Mn₃N₂ films was face center tetragonal (a = 0.4205 nm, c = 1.2131 nm), and it had properties of antiferromagnetism with 0.4 μ_B per unit cell.

収録刊行物

• 表面科学

  表面科学 24 (8), 480-484, 2003

  公益社団法人 日本表面科学会

詳細情報

• CRID: 1390001206456685824
• NII論文ID: 10011734978
• NII書誌ID: AN00334149
• DOI: 10.1380/jsssj.24.480
• COI: 1:CAS:528:DC%2BD3sXotlegsLo%3D
• ISSN: 18814743
• ISSN: 03885321
• ISSN: http://id.crossref.org/issn/03885321
• NDL書誌ID: 6673608
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I6673608
• Web Site: https://www.jstage.jst.go.jp/article/jsssj/24/8/24_8_480/_pdf
• 本文言語コード: ja
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可