鼻部皮膚温度変化による快-不快状態の推定  [in Japanese] Estimation of Unpleasant and Pleasant States by Nasal Thermogram  [in Japanese]

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Author(s)

Abstract

We studied the method for objectively evaluating emotion through FST (Facial Skin Thermogram), which brings less stress and non-contact measurement. We tried to estimate unpleasant and pleasant states on FST with Neural Network. Subjective VAS was precisely estimated at any estimation accuracy.

Journal

  • IEEJ Transactions on Electronics, Information and Systems

    IEEJ Transactions on Electronics, Information and Systems 124(1), 213-214, 2004-01-01

    The Institute of Electrical Engineers of Japan

References:  2

Cited by:  8

Codes

  • NII Article ID (NAID)
    10011820276
  • NII NACSIS-CAT ID (NCID)
    AN10065950
  • Text Lang
    JPN
  • Article Type
    Journal Article
  • ISSN
    03854221
  • Data Source
    CJP  CJPref  J-STAGE 
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