A Technique for Specifying Region of Interest (ROI) in the Vector Field Based on 3D LIC
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- SAKAI Koji
- Graduate School of Software and Information Science, Iwate Prefectural University
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- KOYAMADA Koji
- Academic Center for Computing and Media Studies, Kyoto University
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- SAKAMOTO Naohisa
- Academic Center for Computing and Media Studies, Kyoto University
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- MATSUDA Koichi
- Graduate School of Software and Information Science, Iwate Prefectural University
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- DOI Akio
- Graduate School of Software and Information Science, Iwate Prefectural University
Bibliographic Information
- Other Title
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- 三次元LICに基づくベクタ場の興味領域制限可視化手法
- 3ジゲン LIC ニ モトヅク ベクタジョウ ノ キョウミ リョウイキ セイゲン カシカ シュホウ
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Abstract
Line integral convolution (LIC) is an effective and powerful technique for generating images from vector fields. In the 3D-LIC, it is very important to select an adequate region of interest (ROI) in the vector field. A way for specifying ROI is to use a surface defined in the vector field. Another way is to use a significance setting that defines a ROI related values at each point in the vector field. To represent an anisotropic vector field around a vortex center in an understandable way, we introduced a time-oriented significance setting. Our technique for specifying ROI is to use a passage-time for a mass-less particle to travel from near a vortex center to a pixel location.<br> In our technique, what we call “restricted LIC technique”, we refer to the passage-time buffer before we start the convolution process at a pixel location. The original RLIC technique is based on 2 -D. In this paper, we extend this technique to 3 -D. To confirm the effectiveness of our technique, we use an anisotropic swirl vector field and construct two types of significance settings, which are a distance-oriented and a time-oriented setting. We will show the difference in the resulting images between a distance-oriented and time-oriented significance settings.<br>
Journal
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- The Journal of the Institute of Image Electronics Engineers of Japan
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The Journal of the Institute of Image Electronics Engineers of Japan 32 (6), 815-824, 2003
The Institute of Image Electronics Engineers of Japan
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Details 詳細情報について
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- CRID
- 1390001204612097920
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- NII Article ID
- 130004437431
- 10011891334
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- NII Book ID
- AN00041650
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- ISSN
- 13480316
- 02859831
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- NDL BIB ID
- 6793686
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed